High magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
Surface oxide formed during oxidation of experimental W-rich Ni-base superalloys in simulated impure-He environment. SE image recorded on Philips XL30 FEG SEM at 20kV
Image by Raghav Adharapurapu, Prof. Pollock's Research Group
A scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.
Image by FEI
SEM image of the structure of crystals of Fe2O3 grown by chemical vapor deposition. The largest cluster is ~2µm in diameter.
Image by Michelle Przybylek from the Linic Research Group.
SEM image of a University of Michigan seal milled into an InAs wafer using a low current focused ion beam (FIB) and low ion dose. The outer diameter of the seal is ~ 9.7 µm.
Image by Kevin Grossklaus, Millunchick Research Group.
High magnification image of NiTi “nano-column” on carbon nanotube forest substrate . SE image on Nova Nanolab taken at 10 kV.
Image by Anne Juggernauth
High magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
Location: 421 Space Research Building
Phone: (734) 936-3350
View of the NanoInstruemtns NanoIndenter II in room 421 of the North Campus EMAL. The image is brought to you via an Axis 206 Network Camera.
