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O Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the Oxygen K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield

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O Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the Oxygen K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield

FEI Nova 200 Nanolab Dualbeam FIB in the North Campus EMAL

Location: Room G023, Building 22 of The North Campus Research Complex
Phone:+1-(734) 764-2944

View of the FEI Nova 200 Nanolab Dualbeam FIB in room G023 of Building 22 of The North Campus Research Complex. The image is brought to you by an Axis M1013 Internet Camera

Pan-Tilt control of this video camera is available to users who have a password.