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Bend contours in a Ni-8Al-4Ge alloy

Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.

Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.

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Bend contours in a Ni-8Al-4Ge alloy

Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.

Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.

Title: Description:

FEI Nova 200 Nanolab Dualbeam FIB in the North Campus EMAL

Location: 415 Space Research Building
Phone: (734) 936-3350

View of the FEI Nova 200 Nanolab Dualbeam FIB in room 426 of the North Campus EMAL. The image is brought to you from a Sony EVI-D30 Video Camera via an Axis 240Q Video Server.

Pan-Tilt control of this video camera is available to users who have a password.