Low magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
SEM image of porous silicon.
Image by EMAL Staff
SEM image of porous silicon.
Image by EMAL Staff
Transmission electron microscope image of a rossette of rutile titanium oxide in a matrix of anatase titanium oxide.
Image by John Mansfield
An XEDS map of a semiconductor chip, green is the silicon K alpha line, yellow is the gols M alpha line and red the carbon K line.
Image by John Mansfield
TEM image of dislocations in a silicon and silicon-gremanium thin film system.
Image by John Mansfield
Low magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
Location: 415 Space Research Building
Phone: (734) 936-3350
View of the FEI Nova 200 Nanolab Dualbeam FIB in room 426 of the North Campus EMAL. The image is brought to you from a Sony EVI-D30 Video Camera via an Axis 2400 Video Server.
Pan-Tilt control of this video camera is available to users who have a password.
