TEM image of dislocations in a silicon and silicon-gremanium thin film system.
Image by John Mansfield
ZnO "barbed wire" crystals grown on carbon nanotubes.
Image by John Hart Group
An X-ray energy dispersive spectormetry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield
Silicon <111> convergent beam electron diffraction pattern, bright field disc showing 3m symmetry.
Pattern by John Mansfield
Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.
Image by Pan Group
Medium magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
TEM image of dislocations in a silicon and silicon-gremanium thin film system.
Image by John Mansfield
Location: 415 Space Research Building
Phone: (734) 936-3350
View of the FEI Quanta 3D Dualbeam FIB in room 422 of the North Campus EMAL. The image is brought to you via an Axis 2100 Network Camera.
Pan-Tilt control of this video camera is available to users who have a password.
