SEM image of porous silicon.Image by EMAL Staff
An XEDS map of a semiconductor chip, green is the silicon K alpha line, yellow is the gols M alpha line and red the carbon K line.Image by John Mansfield
High magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.Image by John Mansfield
TEM image of soot particles on a holey carbon support film.Image by EMAL Staff
Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.
Location: 415 Space Research Building
Phone: (734) 936-3350
View of the FEI Quanta 3D Dualbeam FIB in room 422 of the North Campus EMAL. The image is brought to you via an Axis 206 Network Camera.
College of Engineering | College of Literature, Science, and the Arts