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HREM image of grains of silicon nitride

Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.

Image by Pan Group

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HREM image of grains of silicon nitride

Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.

Image by Pan Group

The EMAL JEOL 2010F Analytical Electron MicroscopeF

Location: Room G020, Building 22 of The North Campus Research Complex
Phone: (734) 936-0630

View of the JEOL 2011F in room 431 of the North Campus EMAL. The image is brought to you from a Sony EVI-D30 Video Camera via an Axis 240Q Video Server.

Pan-Tilt control of this video camera is available to users who have a password.