Scanning electron microscope image a cluster of nanotubes of cadmium telluride.Image by John Mansfield
HAADF STEM image of a bright Pt particle in barium cerium oxide.Image by Shuyi Zhang from the Pan Research Group.
Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.
Transmission electron microscope image of a rossette of rutile titanium oxide in a matrix of anatase titanium oxide.Image by John Mansfield
An X-ray energy dispersive spectrometry map recorded using the Oxygen K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.Image by John Mansfield
A precipitate of M23X6 in a 316 stainless steeel sample. Fringes are the dislcations at the interfaces between the matrix and the precipitate.Image by John Mansfield
Location: Room G032, Building 22 of The North Campus Research Complex
Phone: (734) 764-2938
Above: View of the JEOL 2100F in Room G032, Building 22 of The North Campus Research Complex. The image is brought to you from an Axis M1013 Network Camera.
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