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Porous Si at High Magnification

SEM image of porous silicon.

Image by EMAL Staff

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Porous Si at High Magnification

SEM image of porous silicon.

Image by EMAL Staff

The EMAL JEOL 2100F Cs-Corrected Scanning Transmission Electron Microscope

Location: 415 Space Research Building
Phone: (734) 936-0630

Left: View of the JEOL 2100F in room 432 of the North Campus EMAL. The image is brought to you from an Axis M1011 Network Camera.