SEM image of porous silicon.Image by EMAL Staff
High magnification of metal coated carbon nanotube bundles prepared by sputter deposition. SE image on Nova Nanolab taken at 10 kV.Image taken by Anne Juggernauth
Convergent beam electron diffraction pattern of M23X6, a metal carbo-nitro-boride common in steels.Pattern by John Mansfield
An X-ray energy dispersive spectrometry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.Image by John Mansfield.
Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.
A high angle annular dark field scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.Image by FEI
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