SEM Image.Image by Ashley Bielinski, the Dasgupta Research Group.
Geological section of mulitples phases with various levles of Ca within them. Image recorded in Ca K Alpha line.Image by Bob Anderhalt
Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.
HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe2As2.Image by Shuyi Zhang from the Pan Research Group.
High magnification of metal coated carbon nanotube bundles prepared by sputter deposition. SE image on Nova Nanolab taken at 10 kV.Image taken by Anne Juggernauth
Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.Image by Kevin Grossklaus, Millunchick Research Group
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