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Al Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield.

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Al Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield.

The EMAL JEOL 2100F Cs-Corrected Scanning Transmission Electron Microscope

Location: 415 Space Research Building
Phone: (734) 936-0630

Left: View of the JEOL 2100F in room 432 of the North Campus EMAL. The image is brought to you from an Axis M1011 Network Camera.