Selected area diffraction pattern of alloy phase with strong structure factor intensity variation in the 00X spots.Image by John Mansfield
A high angle annular dark field scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.Image by FEI
Convergent beam electron diffraction pattern of M23X6, a metal carbo-nitro-boride common in steels.Pattern by John Mansfield
An XEDS map of a semiconductor chip, green is the silicon K alpha line, yellow is the gols M alpha line and red the carbon K line.Image by John Mansfield
HAADF STEM image of a bright Pt particle in barium cerium oxide.Image by Shuyi Zhang from the Pan Research Group.
A precipitate of M23X6 in a 316 stainless steeel sample. Fringes are the dislcations at the interfaces between the matrix and the precipitate.Image by John Mansfield
Location: Room G032, Building 22 of The North Campus Research Complex
Phone: (734) 764-2938
Above: View of the JEOL 2100F in Room G032, Building 22 of The North Campus Research Complex. The image is brought to you from an Axis M1013 Network Camera.
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