Twin detail in alloy foil in HREM.
A scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.
Image by FEI
TEM image of soot particles on a holey carbon support film.
Image by EMAL Staff
An X-ray energy dispersive spectormetry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield
Transmission electron microscope image of a rossette of rutile titanium oxide in a matrix of anatase titanium oxide.
Image by John Mansfield
Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.
Image by Pan Group
Twin detail in alloy foil in HREM.
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View of the Kratos Axis Ultra XPS system in room 426 of the North Campus EMAL. The image is brought to you via an Axis 2100 Network Camera.
