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Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

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Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

Kratos Axis Ultra X-ray Photoelectron Spectrometer

Location: Room G019, Building 22 of The North Campus Research Complex
Phone: (734) 764-5621

View of the Kratos Axis Ultra XPS system in Room G019, Building 22 of The North Campus Research Complex. The image is brought to you via an Axis M1011 Network Camera.