A high angle annular dark field scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.
Image by FEI
Surface oxide formed during oxidation of experimental W-rich Ni-base superalloys in simulated impure-He environment. SE image recorded on Philips XL30 FEG SEM at 20kV
Image by Raghav Adharapurapu, Prof. Pollock's Research Group
An X-ray energy dispersive spectrometry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield.
High magnification image of NiTi “nano-column” on carbon nanotube forest substrate . SE image on Nova Nanolab taken at 10 kV.
Image by Anne Juggernauth
High magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.
Image by Pan Group
A high angle annular dark field scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.
Image by FEI
Location: 415 Space Research Building
Phone: (734) 936-3350
View of the Kratos Axis Ultra XPS system in room 426 of the North Campus EMAL. The image is brought to you via an Axis M1011 Network Camera.
