Digitally enhanced HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe2As2.Image by Shuyi Zhang from the Pan Research Group.
An X-ray energy dispersive spectrometry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.Image by John Mansfield.
Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.
Transmission electron microscope image of a rossette of rutile titanium oxide in a matrix of anatase titanium oxide.Image by John Mansfield
Surface oxide formed during oxidation of experimental W-rich Ni-base superalloys in simulated impure-He environment. SE image recorded on Philips XL30 FEG SEM at 20kVImage by Raghav Adharapurapu, Prof. Pollock's Research Group
Scanning electron microscope image of a gold coated AFM tip. Recorded in the FEI Nova NanoLab.Image by Aaron Tan.
Location: 415 Space Research Building
Phone: (734) 936-3350
View of the Kratos Axis Ultra XPS system in room 426 of the North Campus EMAL. The image is brought to you via an Axis M1011 Network Camera.
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