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Bend contours in a Ni-8Al-4Ge alloy

Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.

Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.

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Bend contours in a Ni-8Al-4Ge alloy

Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.

Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.

Title: Description:

Kratos Axis Ultra X-ray Photoelectron Spectrometer

Location: Room G019, Building 22 of The North Campus Research Complex
Phone: (734) 764-5621

View of the Kratos Axis Ultra XPS system in Room G019, Building 22 of The North Campus Research Complex. The image is brought to you via an Axis M1011 Network Camera.