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Si Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield

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Si Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield

Kratos Axis Ultra X-ray Photoelectron Spectrometer

Location: Room G019, Building 22 of The North Campus Research Complex
Phone: (734) 764-5621

View of the Kratos Axis Ultra XPS system in Room G019, Building 22 of The North Campus Research Complex. The image is brought to you via an Axis M1011 Network Camera.