Medium magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
Selected area diffraction pattern of alloy phase with strong structure factor intensity variation in the 00X spots.
Image by John Mansfield
ZnO "barbed wire" crystals grown on carbon nanotubes.
Image by John Hart Group
Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.
Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.
SEM image of a University of Michigan seal milled into an InAs wafer using a low current focused ion beam (FIB) and low ion dose. The outer diameter of the seal is ~ 9.7 µm.
Image by Kevin Grossklaus, Millunchick Research Group.
High magnification image of NiTi “nano-column” on carbon nanotube forest substrate . SE image on Nova Nanolab taken at 10 kV.
Image by Anne Juggernauth
Medium magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
Location: 415 Space Research Building
Phone: (734) 936-3350
View of the Philips/FEI XL30 ESEM in room 422 of the North Campus EMAL. The image is brought to you via an Axis 206 Network Camera.
