Digitally enhanced HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe2As2.Image by Shuyi Zhang from the Pan Research Group.
An XEDS map of a semiconductor chip, green is the silicon K alpha line, yellow is the gols M alpha line and red the carbon K line.Image by John Mansfield
SEM Image.Image by Ashley Bielinski, the Dasgupta Research Group.
TEM image of soot particles on a holey carbon support film.Image by EMAL Staff
An X-ray energy dispersive spectrometry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.Image by John Mansfield
Scanning electron microscope image of a gold coated AFM tip. Recorded in the FEI Nova NanoLab.Image by Aaron Tan.
Location: 415 Space Research Building
Phone: (734) 936-3350
View of the Philips/FEI XL30 ESEM in room 422 of the North Campus EMAL. The image is brought to you via an Axis 206 Network Camera.
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