SEM image of porous silicon.Image by EMAL Staff
Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.Image by Kevin Grossklaus, Millunchick Research Group
InAs islands grown by molecular beam epitaxy on an InP substrate patterned by FIB milling. SE image recorded on FEI Nova Nanolab at 5 kV.Image by Kevin Grossklaus, Prof. Mirecki-Millunchick's Research Group
Selected area diffraction pattern of alloy phase with strong structure factor intensity variation in the 00X spots.Image by John Mansfield
HAADF STEM image of a bright Pt particle in barium cerium oxide.Image by Shuyi Zhang from the Pan Research Group.
Geological section of mulitples phases with various levles of Ca within them. Image recorded in Ca K Alpha line.Image by Bob Anderhalt
Location: 415 Space Research Building
Phone: (734) 936-3350
View of the Philips/FEI XL30 ESEM in room 422 of the North Campus EMAL. The image is brought to you via an Axis 206 Network Camera.
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