HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe2As2.Image by Shuyi Zhang from the Pan Research Group.
An X-ray energy dispersive spectrometry map recorded using the Oxygen K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.Image by John Mansfield
Silicon <111> convergent beam electron diffraction pattern, bright field disc showing 3m symmetry.Pattern by John Mansfield
Low magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.Image by John Mansfield
Transmission electron microscope image of a rossette of rutile titanium oxide in a matrix of anatase titanium oxide.Image by John Mansfield
InAs islands grown by molecular beam epitaxy on an InP substrate patterned by FIB milling. SE image recorded on FEI Nova Nanolab at 5 kV.Image by Kevin Grossklaus, Prof. Mirecki-Millunchick's Research Group
Location: 415 Space Research Building
Phone: (734) 936-3350
View of the Philips/FEI XL30 ESEM in room 422 of the North Campus EMAL. The image is brought to you via an Axis 206 Network Camera.
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