High magnification of metal coated carbon nanotube bundles prepared by sputter deposition. SE image on Nova Nanolab taken at 10 kV.Image taken by Anne Juggernauth
Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.
An XEDS map of a semiconductor chip, green is the silicon K alpha line, yellow is the gols M alpha line and red the carbon K line.Image by John Mansfield
Medium magnification image of 500nm film of NiTi sputtered on carbon nanotube forest. SE image on Nova Nanolab taken at 10 kV.Image taken by Anne Juggernauth
SEM image of nanotube forests assembled into the likeness of Barack Obama.Image by Sameh Tawfick
HAADF STEM image of a bright Pt particle in barium cerium oxide.Image by Shuyi Zhang from the Pan Research Group.
Location: 415 Space Research Building
Phone: (734) 936-3350
View of the Philips/FEI XL30 ESEM in room 422 of the North Campus EMAL. The image is brought to you via an Axis 206 Network Camera.
College of Engineering | College of Literature, Science, and the Arts