Play
Close
chip1024_AlK.jpg

Al Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield.

Caption Arrow

Al Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield.

Philips/FEI XL30FEG SEM Electron Microscope in the North Campus EMAL

Location: Room G027, Building 22 of The North Campus Research Complex
Phone: (734) 764-5623

This page displays a streaming video of the Philips/FEI XL30FEG SEM in Room G027, Building 22 of The North Campus Research Complex, a live stream of the SEM video and a stream from a TV camera monitoring the current through the Faraday cup that is used to measure beam current .

Left: This image of the microscope room is brought to you via an Axis 206 Network Camera.