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HREM image of grains of silicon nitride

Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.

Image by Pan Group

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HREM image of grains of silicon nitride

Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.

Image by Pan Group

Philips/FEI XL30FEG SEM Electron Microscope in the North Campus EMAL

Location: Room G027, Building 22 of The North Campus Research Complex
Phone: (734) 764-5623

This page displays a streaming video of the Philips/FEI XL30FEG SEM in Room G027, Building 22 of The North Campus Research Complex, a live stream of the SEM video and a stream from a TV camera monitoring the current through the Faraday cup that is used to measure beam current .

Left: This image of the microscope room is brought to you via an Axis 206 Network Camera.