Play
Close
WBDF_InGaAs.jpg

Dislocations in a strained InGaAs film

Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.

Image by Kevin Grossklaus, Millunchick Research Group

Caption Arrow

Dislocations in a strained InGaAs film

Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.

Image by Kevin Grossklaus, Millunchick Research Group

Philips/FEI XL30FEG SEM Electron Microscope in the North Campus EMAL

Location: 425 Space Research Building
Phone: (734) 936-0630

This page displays a streaming video of the Philips/FEI XL30FEG SEM in room 432 of the North Campus EMAL together with live from a TV camera monitoring the current through the Faraday cup that is used to measure beam current .

Left: This image of the microscope room is brought to you via an Axis 206 Network Camera.

Right: View of the picoammeter used to measure the beam current in the XL30FEG in the North Campus EMAL. Image bought to you via an analog TV camera connected to an Axis 240Q Network Video Server.

If the picoammeter is not active, the faraday cup may not be in the microscope.