Porous Si at High Magnification
SEM image of porous silicon.
Image by EMAL Staff
SEM image of porous silicon.
Image by EMAL Staff
Medium magnification image of 500nm film of NiTi sputtered on carbon nanotube forest. SE image on Nova Nanolab taken at 10 kV.
Image taken by Anne Juggernauth
An X-ray energy dispersive spectrometry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield.
Geological section of mulitples phases with various levles of Ca within them. Image recorded in Ca K Alpha line.
Image by Bob Anderhalt
SEM image of the structure of crystals of Fe2O3 grown by chemical vapor deposition. The largest cluster is ~2µm in diameter.
Image by Michelle Przybylek from the Linic Research Group.
Transmission electron microscope bright field (left) and dark field (right) image pair of a thin film of a gamma/gamma' nickel based superalloy.
Image by EMAL Staff
SEM image of porous silicon.
Image by EMAL Staff
Location: 425 Space Research Building
Phone: (734) 936-0630
This page displays a streaming video of the Philips/FEI XL30FEG SEM in room 432 of the North Campus EMAL together with live from a TV camera monitoring the current through the Faraday cup that is used to measure beam current .
Left: This image of the microscope room is brought to you via an Axis 206 Network Camera. |
Right: View of the picoammeter used to measure the beam current in the XL30FEG in the North Campus EMAL. Image bought to you via an analog TV camera connected to an Axis 240Q Network Video Server. |