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Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

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Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

Philips/FEI XL30FEG SEM Electron Microscope in the North Campus EMAL

Location: 425 Space Research Building
Phone: (734) 936-0630

This page displays a streaming video of the Philips/FEI XL30FEG SEM in room 432 of the North Campus EMAL together with live from a TV camera monitoring the current through the Faraday cup that is used to measure beam current .

Left: This image of the microscope room is brought to you via an Axis 206 Network Camera.

Right: View of the picoammeter used to measure the beam current in the XL30FEG in the North Campus EMAL. Image bought to you via an analog TV camera connected to an Axis 240Q Network Video Server.

If the picoammeter is not active, the faraday cup may not be in the microscope.