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Bend contours in a Ni-8Al-4Ge alloy

Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.

Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.

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Bend contours in a Ni-8Al-4Ge alloy

Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.

Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.

Title: Description:

Philips/FEI XL30FEG SEM Electron Microscope in the North Campus EMAL

Location: Room G019, Building 22 of The North Campus Research Complex
Phone: (734) 764-5623

This page displays a streaming video of the Philips/FEI XL30FEG SEM in Room G027, Building 22 of The North Campus Research Complex, a live stream of the SEM video and a stream from a TV camera monitoring the current through the Faraday cup that is used to measure beam current .

Left: This image of the microscope room is brought to you via an Axis 206 Network Camera.

Right: View of the picoammeter used to measure the beam current in the XL30FEG in the North Campus EMAL. Image bought to you via an analog TV camera connected to an Axis 240Q Network Video Server.

If the picoammeter is not active, the faraday cup may not be in the microscope.

Above: This image is a live feed of the SEM video. If the image is a black frame, then proprietary research maybe underway and the image has been turned off.