North Campus Instruments - JEOL 3011 High Resolution Electron Microscope

Applications

HREM

Accelerating Voltages

100 to 000 kV (100 V steps)

High Voltage Stability

2ppm/minute

Vacuum

~1.5x10^-7 torr (Gun Area) ~1.5x10^-7 torr (Specimen Area)

Imaging Specifications

Objective Current Stability: 1ppm/minute Objective Focal Length: 2.5 mm Spherical Aberration Coef. (Cs): 0.6 mm Chromatic Aberration Coef. (Cc): 1.3 mm Minimum Focus Step: 1 nm Point-to-Point Resolution: 0.17 nm Lattice Resolution: 0.14 nm

Specimen Stage

Specimen Tilt: ±30 degrees Specimen Diameter: 3.0 mm

TV & Digital Image Aquisition System

Gatan 794 Slow Scan CCD TV system and Gatan 622SC image intensified TV rate camera. Slow scan system acquires digital images to a Windows XP computer.

Patricia Savage, a UROP student from the Department of Materials Science & Engineering operating the JEOL 3011. Light painting by Arron Kiley. High Resolution Electron Microscopy High Resolution Electron Microscopy is phase contrast microscopy of the atomic structure of materials. Specimen stages in these instruments are typically in the high-stability, top-entry configuration. An image intensified TV system allows the observation of the structure images on a TV screen prior to the recording of micrographs. Dynamic experiments are usually recorded onto video tape. A computer controlled image acquisition and analysis package is invaluable for the capture and storage of images of both on-line and off-line analysis and comparison with images calculated with multislice algorithims.