Central Campus Instruments - Philips CM12

Applications

SAED, CBED, Diffraction Contrast Imaging

Accelerating Voltage

0 to 120 kV (20 kV steps)

Filament

Single crystal Lanthanum hexaboride

Vacuum

~1.5 x10^-7 torr

Resolution

CTEM 0.20 nm lattice, 0.34 nm point-to-point

Detectors

SEM/STEM Imaging: Everhart-Thornley & Solid State STEM Detector XEDS: Kevex UTW Quantum Detector and Kevex 8000 Acquisition System

Sample Holders

Philips Single-Tilt (±45 degrees) Stage. Gatan modified Philips Double-Tilt stage (x=±45 degrees,y=±30 degrees) Low Background (Be) Stage

Lishun Kao, a postgraduate student in Geological Sciences optimizing a STEM image on the Philips CM12. Analytical Electron Microscopy Analytical Electron Microscopy is a generic term that is applied to any study where a variety of analysis techniques are used within one particular microscope. These techniques typically include X-ray Energy Dispersive Spectroscopy (XEDS), Electron Energy Loss Spectroscopy (EELS), Selected Area Electron Diffraction (SAED), Convergent Beam Electron Diffration (CBED), Scanning Transmission Electron Microscopy, and Scanning Electron Microscopy. These techniques are briefly described in the glossary. The University of Michigan EMAL has three analytical microscopes. They range in complexity form a fully commissioned instrument equipped for all of the above techniques to a basic CBED analysis instrument.