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Cameca SX-100
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Central Campus Instruments - Cameca SX-100 Electron Microprobe Analyzer
Location: 2501 C. C. Little Building
Contact:
Carl Henderson
Acknowledgments: Publications resulting from work on this instrument should acknowledge the support of NSF grant #EAR-9911352.
| Applications |
- WDS
- SE/BSE/AEI/CL imaging
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| Accelerating Voltage |
- 5-50kV (continuously variable)
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| Filament |
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| Vacuum |
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| SEM Resolution |
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| WDS System |
- 5 WDS channels covering elements Be-U.
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| Stage Control |
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| XEDS System |
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| Additional Features |
- large WD crystals
- auto optical focus
- digital image acquisition
- wide array of software packages
- CL fiber optic spectrometer
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Artur Deditius, a post-doctoral researcher in the
Department of Geological Sciences, originally from Poland, operates
the Cameca SX-100 Microprobe Analyzer.
Electron Microprobe Analyzer
The instrument utilizes both tungsten and cerium hexaboride sources between 0 and 50 keV and has five
vertical wavelength-dispersive spectrometers with a full range of crystal types.
The system is extensively computer controlled by both Unix and PC workstations.
Other analysis techniques that are available on the instrument compliment the electron microprobe functions and
include: a Röntec silicon-drift X-ray energy dispersive spectrometer,
secondary electron, backscattered electron and absorbed current imaging
and transmitted and reflected light imaging. Cathodoluminescence
spectroscopy and imaging experiments are also possible.
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Copyright ©
EMAL & MSE Department, University of Michigan &
John F. Mansfield
(
jfmjfm@umich.edu)
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