North Campus Instruments - Kratos Axis Ultra XPS

Applications

XPS

X-ray Sources

Operating Conditions

Vacuum System

Specimen Stage

Analysis Area

Detector System

Computer System

Accessories

Sample Requirements

Samples should be approximately 10mm diameter/square and no more than 2mm thick. Thicker samples can be accommodated in alternate sample holders but must be less than 8mm x 15mm and less than ~10mm thick. Samples with an analysis area smaller than 5mm diameter are not recommended. Samples must be compatible with high vacuum, i.e. clean and dry. Powder samples must be compacted into a pellet, pounded into soft Indium metal, or otherwise secured to the holder.

Lindsay Shuller, a graduate student in the Department of Geological Sciences, positioning her sample in the Kratos Analytical Axis Ultra X-ray photoelectron spectrometer. Lindsay is assisted by C.V. Ramana, a potdoctoral fellow from Geological Sciences and Sara Worsham, an undergraduate student in the College of Literature Sciences and the Arts. X-ray Photoelectron Spectroscopy X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA), uses soft X-rays to produce photoelectrons from the surface layers of atoms in a solid sample. The emitted electrons are analyzed according to their kinetic energy and the spectrum so produced is used to identify the elements present and their chemical states. Additional Resources: References Example XPS data. Table of peak positions and sensitivity factors. High Resolution XPS spectra of polymer samples (from Kratos Analytical). Flash Animations XPS electron transition