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Al Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield.

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Al Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield.

EM & Surface Analysis Software

The following software packages are available on the EMAL data acquisiton and analysis computers.

Note this software, unless otherwise noted, is licensed for EMAL use only and any other use constitutes an infringement of the University's acceptable use policies. So, please refrain from making your own copies of the software, thank you.

Macintosh

PC

Macintosh/PC