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HREM image of grains of silicon nitride

Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.

Image by Pan Group

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HREM image of grains of silicon nitride

Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.

Image by Pan Group

EM & Surface Analysis Software

The following software packages are available on the EMAL data acquisiton and analysis computers.

Note this software, unless otherwise noted, is licensed for EMAL use only and any other use constitutes an infringement of the University's acceptable use policies. So, please refrain from making your own copies of the software, thank you.

Macintosh

PC

Macintosh/PC