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Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

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Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

EM & Surface Analysis Software

The following software packages are available on the EMAL data acquisiton and analysis computers.

Note this software, unless otherwise noted, is licensed for EMAL use only and any other use constitutes an infringement of the University's acceptable use policies. So, please refrain from making your own copies of the software, thank you.

Macintosh

PC

Macintosh/PC