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HREM image of grains of silicon nitride

Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.

Image by Pan Group

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HREM image of grains of silicon nitride

Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.

Image by Pan Group

Instrument Training - Who to Contact

The following instruments are available in the University of Michigan Electron Microbeam Analysis Laboratory.

For help or training on different instruments in EMAL, please contact the appropriate lab manager, or one of the people listed for the instrument you are interested in.

If you are new to EMAL and don't know how to gain access to the facilities, please read the help page.

Instrument Contact for Training
North Campus Lab Manager: John Mansfield
Digital Instruments Scanning Force Microscope IIIa John Mansfield: jfmjfm@umich.edu
Ying Qi: yqi@umich.edu
Kai Sun: kaisun@umich.edu
Haiping Sun: haipings@umich.edu
Digital Instruments Scanning Force Microscope E (with Hysitron Triboscope Picoindenter system) Ying Qi: yqi@umich.edu
FEI Nova Nanolab Dualbeam Focussed Ion Beam Workstation and Scanning Electron John Mansfield: jfmjfm@umich.edu
Kai Sun: kaisun@umich.edu
Haiping Sun: haipings@umich.edu
FEI Quanta 200 3D Environmental Scanning Electron Microscope John Mansfield: jfmjfm@umich.edu
Kai Sun: kaisun@umich.edu
Haiping Sun: haipings@umich.edu
JEOL 2010F Analytical Transmission Electron Microscope John Mansfield: jfmjfm@umich.edu
Kai Sun: kaisun@umich.edu
Haiping Sun: haipings@umich.edu
JEOL 3011 High Resolution Electron Microscope John Mansfield: jfmjfm@umich.edu
Kai Sun: kaisun@umich.edu
Haiping Sun: haipings@umich.edu
Kratos Axis Ultra X-ray Photoelectron Spectrometer Kai Sun: kaisun@umich.edu
Haiping Sun: haipings@umich.edu
Ying Qi: yqi@umich.edu
Philips XL30 FEG Scanning Electron Microscope John Mansfield: jfmjfm@umich.edu
Kai Sun: kaisun@umich.edu
Haiping Sun: haipings@umich.edu
Philips XL30 Environmental Scanning Electron Microscope John Mansfield: jfmjfm@umich.edu
Kai Sun: kaisun@umich.edu
Haiping Sun: haipings@umich.edu
NanoIndenter Ying Qi: yqi@umich.edu
Central Campus Lab Manager: Carl Henderson
Cameca CAMEBAX Electron Microprobe Analyzer (4 Spectrometers) Carl Henderson: chender@umich.edu
Cameca SX-100 Electron Microprobe Analyzer (6 Spectrometers) Carl Henderson: chender@umich.edu
Hitachi S3200N Scanning Electron Microscope Carl Henderson: chender@umich.edu
Philips CM12 Scanning Transmission Electron Microscope Carl Henderson: chender@umich.edu