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Ridged Morphology of Aluminum Oxide formed on Ni-Al-Cr-W superalloy

Surface oxide formed during oxidation of experimental W-rich Ni-base superalloys in simulated impure-He environment. SE image recorded on Philips XL30 FEG SEM at 20kV

Image by Raghav Adharapurapu, Prof. Pollock's Research Group

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Ridged Morphology of Aluminum Oxide formed on Ni-Al-Cr-W superalloy

Surface oxide formed during oxidation of experimental W-rich Ni-base superalloys in simulated impure-He environment. SE image recorded on Philips XL30 FEG SEM at 20kV

Image by Raghav Adharapurapu, Prof. Pollock's Research Group

Instrument Training - Who to Contact

The following instruments are available in the University of Michigan Electron Microbeam Analysis Laboratory.

For help or training on different instruments in EMAL, please contact the appropriate lab manager, or one of the people listed for the instrument you are interested in.

If you are new to EMAL and don't know how to gain access to the facilities, please read the help page.

Instrument Contact for Training
North Campus Lab Manager: John Mansfield
Digital Instruments Scanning Force Microscope Icon John Mansfield: jfmjfm@umich.edu
Kai Sun: kaisun@umich.edu
Haiping Sun: haipings@umich.edu
FEI Helios 650 Nanolab Dualbeam Focussed Ion Beam Workstation and Scanning Electron John Mansfield: jfmjfm@umich.edu
Kai Sun: kaisun@umich.edu
Haiping Sun: haipings@umich.edu
FEI Nova 200 Nanolab Dualbeam Focussed Ion Beam Workstation and Scanning Electron John Mansfield: jfmjfm@umich.edu
Kai Sun: kaisun@umich.edu
Haiping Sun: haipings@umich.edu
FEI Quanta 200 3D Environmental Scanning Electron Microscope John Mansfield: jfmjfm@umich.edu
Kai Sun: kaisun@umich.edu
Haiping Sun: haipings@umich.edu
JEOL 2010F Analytical Transmission Electron Microscope John Mansfield: jfmjfm@umich.edu
Kai Sun: kaisun@umich.edu
Haiping Sun: haipings@umich.edu
JEOL 2100F Analytical Transmission Electron Microscope Kai Sun: kaisun@umich.edu
Haiping Sun: haipings@umich.edu
JEOL 3011 High Resolution Electron Microscope John Mansfield: jfmjfm@umich.edu
Kai Sun: kaisun@umich.edu
Haiping Sun: haipings@umich.edu
Kratos Axis Ultra X-ray Photoelectron Spectrometer Kai Sun: kaisun@umich.edu
Haiping Sun: haipings@umich.edu
Ying Qi: yqi@umich.edu
Philips XL30 FEG Scanning Electron Microscope John Mansfield: jfmjfm@umich.edu
Kai Sun: kaisun@umich.edu
Haiping Sun: haipings@umich.edu
Philips XL30 Environmental Scanning Electron Microscope John Mansfield: jfmjfm@umich.edu
Kai Sun: kaisun@umich.edu
Haiping Sun: haipings@umich.edu
NanoIndenter Ying Qi: yqi@umich.edu
Central Campus Lab Manager: Gordon Moore
Cameca CAMEBAX Electron Microprobe Analyzer (4 Spectrometers) Gordon Moore: gmmoore@umich.edu
Cameca SX-100 Electron Microprobe Analyzer (6 Spectrometers) Gordon Moore: gmmoore@umich.edu
Hitachi S3200N Scanning Electron Microscope Gordon Moore: gmmoore@umich.edu
Physical Electronics 680 Auger Nanoprobe Gordon Moore: gmmoore@umich.edu