BF and DF pair of Gamma/Gamma'
Transmission electron microscope bright field (left) and dark field (right) image pair of a thin film of a gamma/gamma' nickel based superalloy.
Image by EMAL Staff
Transmission electron microscope bright field (left) and dark field (right) image pair of a thin film of a gamma/gamma' nickel based superalloy.
Image by EMAL Staff
TEM image of soot particles on a holey carbon support film.
Image by EMAL Staff
An X-ray energy dispersive spectormetry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield
Low magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
Medium magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
Twin detail in alloy foil in HREM.
Transmission electron microscope bright field (left) and dark field (right) image pair of a thin film of a gamma/gamma' nickel based superalloy.
Image by EMAL Staff
There are in fact, two different EMAL Authorization forms, which one you must use is dictated by your institutinal affiliation:
Users from outside the University of Michigan are requested to provide the same information, however, they are also asked to furnish a purchase order to which the usage can be charged. Purchase orders should be made out to "The University of Michigan Electron Microbeam Analysis Laboratory" and mailed or faxed to the laboratory. The User Fees vary depending on the type of user and the time of day that the equipment is used.