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HAADF STEM Image of Copper Aluminum Precipitates

A high angle annular dark field scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.

Image by FEI

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HAADF STEM Image of Copper Aluminum Precipitates

A high angle annular dark field scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.

Image by FEI

News Archive

These pages contain an archive of the significant events in the University of Michigan Electron Microbeam Analysis Laboratory. Brief descriptions of the articles follow: