Play
Close
chip1024_OK.jpg

O Map on Semiconductor Chip

An X-ray energy dispersive spectormetry map recorded using the Oxygen K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield

Caption Arrow

O Map on Semiconductor Chip

An X-ray energy dispersive spectormetry map recorded using the Oxygen K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield

News Archive

These pages contain an archive of the significant events in the University of Michigan Electron Microbeam Analysis Laboratory. Brief descriptions of the articles follow: