• 

  Michigan Seal Milled into InAs using a Focused Ion Beam

  SEM image of a University of Michigan seal milled into an InAs wafer using a low current focused ion beam (FIB) and low ion dose. The outer diameter of the seal is ~ 9.7 µm.
  Image by Kevin Grossklaus, Millunchick Research Group.

• 

  TEM image of Anatase and Rutile

  Transmission electron microscope image of a rossette of rutile titanium oxide in a matrix of anatase titanium oxide.
  
  Image by John Mansfield

• 

  Fe₂O₃ "cauliflowers"

  SEM image of the structure of crystals of Fe₂O₃ grown by chemical vapor deposition. The largest cluster is ~2µm in diameter.
  Image by Michelle Przybylek from the Linic Research Group.

• 

  HREM image of grains of silicon nitride

  Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.
  
  Image by Pan Group

• 

  Si Map on Semiconductor Chip

  An X-ray energy dispersive spectrometry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
  
  Image by John Mansfield

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Instrument Installation

Removal of The Old JEOL 2000FX and the Delivery and Initial Installation of the New JEOL 2010F

• These are the pictures from the delivery and early installation of the new North Campus EMAL JEOL 2010F Analytical Electron Microscope
• JEOL 2000FX removal February 14th to February 27th 2000. This is a Quicktime movie assembled from a series of images recorded from the EMAL 200FX/2010F Webcam. The movie file size is 7.0Mbyte.
• JEOL 2010F delivery and installation, February 29th to April 19th 2000. This is a Quicktime movie assembled from a series of images recorded from the EMAL 200FX/2010F Webcam. The movie file size is 63.0Mbyte.

Delivery & Installation of the Nova FIB

• Here are the 6 BIG CRATES containing the Nova 200 Nanolab FIB during delivery (December 3, 2003).
• Nova 200 Nanolab FIB Installation.
• The instrument has power and an e-beam!

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