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HAADF STEM Image of Copper Aluminum Precipitates

A high angle annular dark field scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.

Image by FEI

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HAADF STEM Image of Copper Aluminum Precipitates

A high angle annular dark field scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.

Image by FEI

Instrument Installation

Removal of The Old JEOL 2000FX and the Delivery and Initial Installation of the New JEOL 2010F

Delivery & Installation of the Nova FIB