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Dislocations in a strained InGaAs film

Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.

Image by Kevin Grossklaus, Millunchick Research Group

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Dislocations in a strained InGaAs film

Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.

Image by Kevin Grossklaus, Millunchick Research Group

Other Links

There are a number of laboratories on the University of Michigan campus that contain microanalytical equipment that may be available for use. The following is a brief listing of those familiar to EMAL staff, if you wish to be added here please contact John Mansfield or Kai Sun.

Other Microanalytical Facilities Department Links Off Campus Links