Geological XEDS Map
Geological section of mulitples phases with various levles of Ca within them. Image recorded in Ca K Alpha line.
Image by Bob Anderhalt
Geological section of mulitples phases with various levles of Ca within them. Image recorded in Ca K Alpha line.
Image by Bob Anderhalt
Low magnification image of hydrogel crystals carbon nanotube forest substrate. SE image on Nova Nanolab taken at 5 kV.
Image by Anne Juggernauth
Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.
Image by Kevin Grossklaus, Millunchick Research Group
High magnification of metal coated carbon nanotube bundles prepared by sputter deposition. SE image on Nova Nanolab taken at 10 kV.
Image taken by Anne Juggernauth
A high angle annular dark field scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.
Image by FEI
HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe2As2.
Image by Shuyi Zhang from the Pan Research Group.
Geological section of mulitples phases with various levles of Ca within them. Image recorded in Ca K Alpha line.
Image by Bob Anderhalt
There are a number of laboratories on the University of Michigan campus that contain microanalytical equipment that may be available for use. The following is a brief listing of those familiar to EMAL staff, if you wish to be added here please contact John Mansfield or Kai Sun.
Other Microanalytical Facilities