The Publications of John F. Mansfield

John Mansfield
Laboratory Manager
North Campus Electron Microbeam Analysis Lab
417 SRB
University of Michigan
2455 Hayward
Ann Arbor MI 48109-2143
Phone: (313)936-3352 FAX (313)763-5567
jfmjfm@engin.umich.edu or John.F.Mansfield@umich.edu
Conference Abstracts
  1. “Remote control of a scanning electron microscope for research and teaching”, John F. Mansfield, Andy Adamson and Kevin Coffman, Proceedings of The International Kunming Symposium on Microscopy, Kunming, China, July 2-5 2000, (2000) pp 33-35.
  2. “Electron Backscattering in the Environmental Scanning Electron Microscope – The Pressure Limit”, John F. Mansfield, Symposium V: Low Vacuum SEM/ESEM in Materials Science - Wet SEM- the Liquid Frontier of Microscopy, Fall Meeting of MRS, Boston, Mass, Nov 27th – Dec 1st 2000.
  3. “Electron Backscattering in the Environmental Scanning Electron Microscope – The Pressure Limit”, John F. Mansfield, Proceedings of the AMAS VI, University of Sydney February 14th-16th 2001.
  4. Chen H, Spencer NJ, Chang SR, Mansfield JF, Clarkson BH: Effects of Fluoride Ions on Surface Roughness of Enamel Crystals, IADR/AADR/CADR 82, General Session, March 10-13, 2004, Honolulu, Hawaii.
  5. Chen H, Czajka-Jakubowska A, Mansfield JF, Clarkson BH: Direct synthesis of human enamel-like structure in vitro, submitted to AADR/IADR/CADR 85th General Session, Orlando, FL, March 8-11, 2006
Publications
  1. "Microstructural Investigation of AuGeNi contacts on InP", R. J. Graham, J. F. Mansfield & G. M. Rackham, Inst. Phys. Conf. Series No. 61, Chapter 11, p545.
  2. "Convergent Beam Electron Diffraction of Alloy Phases", The Bristol Group, Compiled by John F. Mansfield, pub. by Adam Hilger Ltd, Bristol, UK 1984.
  3. "Error Bars in CBED Symmetry ?", John F. Mansfield, Ultramicroscopy 18 (1985) pp. 91-96.
  4. "Medium-Voltage Analytical Electron Microscopy, Microanalysis Versus Radiation Damage", Nestor J. Zaluzec, John F. Mansfield, Paul R. Okamoto, & Nghi Q. Lam, Inst. Phys. Conf. Series No. 78, Chapter 6, (1986), pp. 173-176.
  5. "Digital Filters & Their Limitations in Data Analysis for Electron Energy Loss Spectroscopy", Nestor J. Zaluzec & John F. Mansfield, Inst. Phys. Conf. Series No. 78, Chapter 16, (1986), pp. 583-386.
  6. "Radiation Effects in X-Ray Microanalysis of a Light Element Alloy in a 300 kV Analytical Electron Microscope", John F. Mansfield, Paul R. Okamoto, Lynn E. Rehn & Nestor J. Zaluzec, Ultramicroscopy 21 (1987) 13-22.
  7. "Identification of Boron in M23X6 Precipitates in 316 Stainless Steel", John F. Mansfield, J. Mat. Sci. 22 (1987) 1277-85.
  8. "A Library of Convergent Beam Electron Diffraction Patterns", John F. Mansfield, Proc 44th EMSA, 1986, 688-691.
  9. "Sputtering, Radiation Damage & Microanalysis", Nestor J. Zaluzec & John F. Mansfield, Proc 44th EMSA, 1986, 708-709
  10. "The Library of Convergent Beam Electron Diffraction Patterns: Update No. 1", John F. Mansfield, Yang-Pi Lin & Roger J. Graham, The Norelco Reporter, pub. by Philips Electronic Instruments Inc. Mahwah, New Jersey Vol 33 1EM 1986, 54-66.
  11. "Electron Sputtering in an AEM: Calculations & Experimental Data", John F. Mansfield & Nestor J. Zaluzec, in Intermediate Voltage Electron Microscopy, Philips Optics Publishing Group (1987) 29-31.
  12. "Examination of Anomalous Fringes in a Silicon 3% Germanium Alloy Layer - Evidence of a Superlattice?", J. F. Mansfield, D. M. Lee and G. A. Rozgonyi, Inst. Phys. Conf. Ser. No. 87 (1987) 169-174.
  13. "A Microstructural Study of Phases in the Y-Ba-Cu-0 System", A.I. Kingon, S. Chevacharoenkul & J.F. Mansfield, Advanced Ceramic Materials 2 678-687 3B (1987).
  14. "Space Group and Chemical Analysis of Y2BaCuO5-x by Convergent Beam Electron Diffraction and X-ray Energy Dispersive Spectroscopy.", John F. Mansfield, Sopa Chevacharoenkul & Angus I. Kingon, Appl. Phys. Lett. 51 (1987) 1035-1037.
  15. "Conventional Convergent Beam Electron Diffraction: Is Fingerprinting A Viable Interpretive Approach?", John F. Mansfield, Proc. AEM (1987) 138-141.
  16. "Critical Issues in CBED: Discussion", D. Bird, D.J. Eaglesham, H.L. Fraser, M.J. Kaufman, J.F, Mansfield & D.B. Williams, Proc. AEM (1987) 176-177.
  17. "Phase Identification by CBED Fingerprinting", Invited Paper. Presented at the 1987 TMS Fall Meeting, Cincinnati, OH. Oct 12-14. 1987
  18. "A Quantitative Model for the Intergranular Precipitation of M7X3 and M23X6 in Ni- 16Cr-9Fe-C-B" R.M. Kruger, G.S. Was, J.F. Mansfield & J.R. Martin., Acta Met. 36 No12 (1988) p3163-76.
  19. "Practical Phase Identification by Convergent Beam Electron Diffraction", John F. Mansfield, Journal of Electron Microscopy Technique, (1989) p 3-15.
  20. "Molecular Beam Hetero-Epitaxial Growth of Strained InGaAs on GaAs", K. H. Chang, P. R. Berger, R. Gibala, P. K. Bhattacharya, J. Singh, J. F. Mansfield, & R. Clarke, in Dislocations and Interfaces in Semiconductors, Eds. K. Rajan, J. Narayan, D. Ast, (1988) 157-171.
  21. "Microstructural Studies of Sputter-Deposited TiN Ceramic Films.", A.R. Pelton, A.W. Dabrowski, L.P. Lehman, C. Ernsberger, A.E. Miller & J.F. Mansfield, Ultramicroscopy 29 (1989) 50-59.
  22. "Surface Cross-Hatched Morphology on Strained III-V Semiconductor Heterostructures" K.H. Chang, R. Gibala, D.J. Srolovitz, PK. Bhattacharya and J.F. Mansfield, Proc. Symp. D, Layered Strucutres: Heteroepitaxy, Superlattices, Strain and Metastability, Fall Meeting MRS Boston Nov 27 - Dec 2 1989. Mat. Res. Soc. Symp. Proc. Vol. 160 (1990) p129-134.
  23. "Cross-Hatched Surface Morphology in Strained III-V Semiconductor Films" K.H. Chang, R Gibala, D.J. Srolovitz, P.K. Bhattacharya and J.F. Mansfield. J. App. Phys. 67 (1990) p4093-4098.
  24. "Thickness Measurement in the Analytical Electron Microscope by Macintosh-based analysis of two-beam convergent beam patterns" John F. Mansfield & Douglas C. Crawford, Proc. XIIth Int. Cong. for EM (1990) p504-505.
  25. "Reliability Issues of InAlAs/InGaAs High-Electron-Mobility Transistors" M. Tutt, G.I. Ng, D. Pavlidis & J. Mansfield, Proc. 3rd Int. Conf. on InP, Cardiff, Wales U.K. April 1991.
  26. "Thickness Dependence of the Position of Higher Order Laue Zone Lines in Silicon" John F. Mansfield, David Bird & Martin Saunders, Proc. EMSA/MAS/MSC 1992, Ed. G.W. Bailey, J. Bentley & J. Small, p1182-3.
  27. “Kinetically Controlled Critical Thickness For Coherent Islanding and Thick Highly Strained Pseudomorphic Films of InGaAs on GaAs (100)”, C.W. Snyder, J. F. Mansfield and B.G. Orr, Physical Review B (Condensed Matter), 46, no.15 (1992) 9551-54.
  28. "Thickness dependence of higher order Laue zone line positions at strongly dynamic zone axes.” John F. Mansfield, David Bird & Martin Saunders, Ultramicroscopy 48 (1993) 1-11.
  29. “Analytical Electron Microscopy Studies of Mo5Si3-MoSi2 Eutectic Composites Modified by Erbium Additions”, D.P. Mason, D.C. Van Aken & J.F. Mansfield, MRS Proceedings 1992.
  30. “Design And Construction Of An Electron Back-Scattering Pattern Camera For The Environmental Scanning Electron Microscope, John F. Mansfield, Visit Thaveeprungsriporn & Gary S. Was, Scanning 15 (1993) pIII36-III37
  31. “Design & Construction Of A Tensile Stage For In-Situ Sample Bending In The ESEM” John F. Mansfield, Christine E. Kalnas, J. Wayne Jones, Gary S. Was & Ronald S. Kalnas, Scanning 15 (1993) PIII37-III38
  32. “Determination Of Structure Factors Of Copper By Convergent Beam Electron Diffraction.”, John Mansfield, Martin Saunders, George Burgess, David Bird & Nestor Zaluzec, Proc. 51st MSA (1993) p688-9.
  33. “Development of an Economical Electron Backscattering Diffraction System for an Environmental Scanning Electron Microscope.” V. Thaveeprungsriporn, J.F. Mansfield, D.C. Crawford & G.S. Was, J. Mat. Res 9 (1994) p1887-1894.
  34. “An In Situ Bend Fixture For Deformation And Fracture Studies In The Environmental Scanning Electron Microscope” Kalnas, C.E., Mansfield, J.F., Was, G.S. and J.W. Jones, J. Vac. Sci. & Technol. A 12(3) (1994) p883-885.
  35. “Structural Investigation of Fe Silicide Films Grown by Pulsed Laser Deposition”, O.P. Karpenko, C.H. Olk, S.M. Yalisove , J.F. Mansfield & G.L. Doll, J. Appl. Phys. 76 (1994) p2202-2207.
  36. "A Basic Introduction to Image Processing Using NIH-Image as a Model", John Mansfield, Proc 52nd MSA (1994) p392-393
  37. “A Microstructural and Crystallographic Investigation of Directionally Solidified MoSi2-Mo5Si3 Eutectics”, D. P. Mason, D. C. Van Aken and J. F. Mansfield, Acta metall. mater. 34 (1995) p1189-1199.
  38. “Backgating in Pseudomorphic In0.15Ga0.85As/Al0.25Ga0.75As MODFETs with a GaAs:Er buffer layer” S. Sethi, J. Mansfield, P.K. Bhattacharya, IEEE Electron Device Letters, 1995, IEEE Electron Device Letters Dec. 1995.
  39. “A Few Words On Bits & Bytes: A Tutorial On Image And Spectral Processing For The Novice”, John F. Mansfield, , Proc Microscopy & Microanalysis 1995, Eds. G.W. Bailey, M.H. Ellisman, R. A. Hennigar, & N.J. Zaluzec, p672-673.
  40. “The Development Of An Electronic Microscopy & Microanalysis Journal On The World Wide Web”, John F. Mansfield, Microbeam Analysis 1995: Proceedings of the 29th Annual Conference of the Microbeam Analysis Society (1995), Ed. Edgar S. Etz, p407-408.
  41. “The Development Of An Electronic Microscopy Journal On The World Wide Web”, Proc Microscopy & Microanalysis 1995 (1995), John F. Mansfield, Eds. G.W. Bailey, M.H. Ellisman, R. A. Hennigar, & N.J. Zaluzec, p658-659
  42. "In-situ Atomic Force Microscopy of Pt/Ti Film Morphology Changes On A Microelectronic Gas Sensor Operating At Elevated Temperatures.”, M. DiBattista, S.V. Patel, J.F. Mansfield, J.L. Gland, J.W. Schwank, Proc Microscopy & Microanalysis 1995 (1995), Eds.G.W. Bailey, M.H. Ellisman, R. A. Hennigar, & N.J. Zaluzec, p254-255.
  43. “Chemical Pressure and Charge Density Waves in Rare Earth Tellurides”, E. DiMasi, M.C. Aronsen, J. F. Mansfield, B. Foran & S. Lee, Physical Review B 52 (1995) p14516.
  44. “Release Behavior from Ethylcellulose Coated Pellets: Thermomechanical and Electron Microbeam Studies”, G.M. Derbin, B.O. Palsson, J.F. Mansfield, T.A. Wheatley, J.B. Dressman, Pharm. Tech. 1996.
  45. “Surface Roughness Characterization of Nicalon and HI-Nicalon Ceramic Fibers by Atomic Force Microscopy," N. Chawla, J.W. Holmes, and J.F. Mansfield," Materials Characterization, 35 (1995) pp199-206.
  46. “The Teaching SEM - An Example of Real-Time Remote Control SEM”, John F. Mansfield, Microscopy & Microanalysis 1996, Eds. G.W. Bailey, J.M. Corbett, R.V.M. Dimlich, J.R. Michael and N.J. Zaluzec, 1996, 394.
  47. “Digital Imaging - When Should One Take The Plunge?” John F. Mansfield, Microscopy & Microanalysis 1996, Eds. G.W. Bailey, J.M. Corbett, R.V.M. Dimlich, J.R. Michael and N.J. Zaluzec, 1996, 602.
  48. “A Survey of Detector Options for the “Leaky-Vacuum” SEM, Stuart McKernan & John F. Mansfield, Microscopy & Microanalysis 1996, Eds. G.W. Bailey, J.M. Corbett, R.V.M. Dimlich, J.R. Michael and N.J. Zaluzec, 1996, 832.
  49. “Characterization of Multilayer Thin Film Structures for Gas Sensor Applications”, M. DiBattista, S.V. Patel, K. D. Wise, J. L. Gland, J. Mansfield, and J. W. Schwank, in MRS, Vol. 382, Structure and Properties of Multilayered Thin Films, T. D. Nguyen, B.M. Lairson, B. M. Clemens, K. Sato, S.-C. Shin, Eds., 1995.
  50. “Biological and Materials Science Applications of Environmental Electron Microscopy”, John F. Mansfield, Journal of The Electron Microscopy Society of Thailand, 11 (1996) 22.
  51. “Applications of the Environmental Scanning Electron Microscope”, John Mansfield, Proceedings of EUREM 1996, Dublin Eire. Published on CD-ROM.
  52. "Review of Techniques for Overcoming XEDS Problems in the Environmental Scanning Electron Microscope", John F. Mansfield, Microscopy & Microanalysis, 3 Supplement 2 (1997) Eds. G.W. Bailey, R.V.W. Dimlich, K.B. Alexander, J.J. McCarthy & T.P. Pretlow, 1207.
  53. "TEM Studies of Silicon Nitride-Silicon Carbide Nanocomposites" E.Y. Wang, X. Pan, J.F. Mansfield, T. Kennedy & S. Hampshire", Microscopy & Microanalysis, 3 Supplement 2 (1997) Eds. G.W. Bailey, R.V.W. Dimlich, K.B. Alexander, J.J. McCarthy & T.P. Pretlow, 411.
  54. “A Microfabricated Hot Stage for Scanning Probe Microscopes, Michael DiBattista, Sanjay V. Patel, John F. Mansfield, John L. Gland, and Johannes W. Schwank , submitted to Scanning 1998.
  55. “In-situ elevated temperature imaging of thin films with a microfabicated hot stage for scanning probe microscopes”, Michael DiBattista, Sanjay V. Patel, John F. Mansfield & Johannes W. Schwank, Applied Surface Science 141 (1999) p119-128.
  56. “Quicktime as a Storage Medium for Dynamic Date Sets in In-Situ Electron Microscopy”, John F. Mansfield, Microscopy and Microanalysis 4 (1998) 4.
  57. “A Telepresence Microscopy Research Session in the DOE2000 Materials Microcharacterization Collaboratory”, L.F. Allard, E. Voelkl, T.A. Nolan, C.K. Narula, C. Montreuil, W.C. Bigelow and J.F. Mansfield, Microscopy and Microanalysis 4 (1998) 20.
  58. “Real-Time Remote Control of a Scanning Electron Microscope across the vBNS/Internet2”, John F. Mansfield, Microscopy and Microanalysis 4 (1998) 44.
  59. “X-ray Energy Dispersive Spectroscopy in the Environmental Scanning Electron Microscope”, John F. Mansfield and Brett L. Pennington, Microscopy and Microanalysis 4 (1998) 182.
  60. “Design and Construction of a Quantitative Uniaxial Straining Stage for the Environmental SEM”, John F. Mansfield, Micheal D. Thouless, Justin A. Stefano and Judd Holbrook, Microscopy and Microanalysis 4 (1998) 268.
  61. “Determination of lattice parameter, oxidation state, and composition of individual titanomagnetite/titanomaghemite grains by transmission electron microscopy”, Weiming Zhou, Donald R. Peacor, Rob Van der Voo, and John F. Mansfield, 1999. Journal of Geophysical Research, 104 (1999) 17689-17702.
  62. John F. Mansfield, “An Introduction to Electronic Document Preparation and Submission for Future Microscopy and Microanalysis Meetings”, Microscopy and Microanalysis, 5 (Suppl. 2: Proceedings) (1999), 520-521.
  63. “Environmental SEM Study of Sodium Alginate Beads”, John Mansfield, Petra Eiselt, Julia Yeh and David J. Mooney, Microscopy and Microanalysis, 5 (Suppl. 2: Proceedings) (1999) 300-301
  64. “Full, Real-Time Remote Control Of A Scanning Electron Microscope With A Compact Laptop Computer Via A High Speed Network”, John F. Mansfield, Andy Adamson & Kevin Coffman, Microscopy and Microanalysis 6 (2000) 31-41.
  65. “X-ray Microanalysis in the Environmental SEM: A Challenge or a Contradiction?”, John F. Mansfield, Mikrochimica Acta, 132 (2000) 137-143.
  66. “Bismuth Nanowire Arrays: Syntesis and Galvanometric Properties”, J.M. Heremans, C.M. Thrush, Yu-min Lin, S. Cronin, Z. Zhang, M.S. Dresselhaus & J.F. Mansfield, Physical Review B, 61 (2000) 2921-2930.
  67. Murphy PJM, Morishima Y, Chen H, Galigniana MD, Mansfield JF, Simons SS and Pratt WB: Visualization and Mechanism of Assembly of a Glucocorticoid Receptor-hsp70 Complex that is Primed for Subsequent hsp90-Dependent Opening of the Steroid Binding Cleft, Journal of Biological Chemistry 278(37): 34764-34773, 2003.
  68. Harrell JM, Murphy PJM, Morishima Y, Chen H, Mansfield JF, Galigniana MD, Pratt WB: Evidence for glucocorticoid receptor transport on microtubules by dynein, Journal of Biological Chemistry, 279(52): 54647-54654, 2004.
  69. Paul A Anzalone, John F Mansfield, Lucille A Giannuzzi, “DualBeam Milling and Deposition of Complex Structures Using Bitmap Files and Digital Patterning” Microscopy and Microanalysis, Volume 10, Supplement S02, Aug 2004, pp 1154-1155
  70. JBennett MC, van Lierop J, Berkeley EM, Mansfield JF, Henderson C, Aronson MC, Young DP, Bianchi A, Fisk Z, Balakirev F, Lacerda A, Weak ferromagnetism in CaB6, Physical Review B, 69, 13 p132407 2004.
  71. Chen H, Clarkson BH, Sun K, Mansfield JF: Self-assembly of synthetic hydroxyapatite nanorods into an enamel prism-like structure, Journal of Colloid and Interface Science 288 (2005), p97-103.
  72. Chen H, Sun K, Tang Z, Law RV, Mansfield JF, Clarkson BH: Synthesis of Fluorapatite Nanorods and Nanowires by Direct Precipitation from Solution, Submitted to Crystal Growth & Design, 2006.
  73. Chen H, Tang Z, Liu J, Sun K, Chang SR, Peters MC, Mansfield JF, Clarkson BH: Acellular synthesis of a Human Enamel-like Microstructure, submitted to Advanced Materials, 2005.
  74. Chen H, Czajka-Jakubowska A, Spencer NJ, Mansfield JF, Robinson C, Clarkson BH: The Restructuring of Enamel Crystal Surfaces in the Etiology of Fluorosis, submitted to Journal of Dental Research, 2005, in revision.
  75. Chen H, Clarkson BH, Peters MC, Sun K, Mansfield JF, Law RV: Fluorapatite Nanorod Synthesis and the production of nanorod films, submitted to Journal of Dental Research, 2005.
  76. John Mansfield, John Nees, Gerard Mourou and Almantas Galvanauskas, “High Quality Electron Beams from Laser Wakefield Acceleration: A New Compact Source for Electron Microscopes?” Microscopy & Microanalysis 11 (2005), Supplement 2, 482.
  77. John Mansfield, Rachel Goldman, Richard Laine and Max Shtein, “Nanofabrication with Ion Beams Visualized in the Environmental Scanning Electron Microscope” Microscopy & Microanalysis 11 (2005), Supplement 2, 1350.
  78. Kalyani Chaganti, Ildar Salakhutdinov, Ivan Avrutsky, Gregory W. Auner, John Mansfield "Sub-micron grating fabrication on hafnium oxide thin-film waveguides with focused ion-beam milling", Optics Express, Vol. 14, Issue 9 (May 2006), pp. 4064-4072.
  79. "High Refractory, Low Misfit Ru-Containing Single Crystal Superalloys" by Laura Carroll, Qiang Feng, John Mansfield, and Tresa Pollock, Met Trans 37A (2006) pp2927-2938.