Soot particles on a holey caron film
TEM image of soot particles on a holey carbon support film.
Image by EMAL Staff
BF and DF pair of Gamma/Gamma'
Transmission electron microscope bright field (left) and dark field (right) image pair of a thin film of a gamma/gamma' nickel based superalloy.
Image by EMAL Staff
X-ray Composite Map of Chip
An XEDS map of a semiconductor chip, green is the silicon K alpha line, yellow is the gols M alpha line and red the carbon K line.
Image by John Mansfield
Porous Si at High Magnification
SEM image of porous silicon.
Image by EMAL Staff
CBED of Metal Carbide
Convergent beam electron diffraction pattern of M23X6, a metal carbo-nitro-boride common in steels.
Pattern by John Mansfield
M23X6 Crocodile
A precipitate of M23X6 in a 316 stainless steeel sample. Fringes are the dislcations at the interfaces between the matrix and the precipitate.
Image by John Mansfield
Soot particles on a holey caron film
TEM image of soot particles on a holey carbon support film.
Image by EMAL Staff