InAs islands grown by molecular beam epitaxy on an InP substrate patterned by FIB milling. SE image recorded on FEI Nova Nanolab at 5 kV.Image by Kevin Grossklaus, Prof. Mirecki-Millunchick's Research Group
Transmission electron microscope image of a rossette of rutile titanium oxide in a matrix of anatase titanium oxide.Image by John Mansfield
Geological section of mulitples phases with various levles of Ca within them. Image recorded in Ca K Alpha line.Image by Bob Anderhalt
Medium magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.Image by John Mansfield
Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.
Silicon <111> convergent beam electron diffraction pattern, bright field disc showing 3m symmetry.Pattern by John Mansfield
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