Convergent beam electron diffraction pattern of M23X6, a metal carbo-nitro-boride common in steels.Pattern by John Mansfield
Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.Image by Kevin Grossklaus, Millunchick Research Group
InAs islands grown by molecular beam epitaxy on an InP substrate patterned by FIB milling. SE image recorded on FEI Nova Nanolab at 5 kV.Image by Kevin Grossklaus, Prof. Mirecki-Millunchick's Research Group
Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.
An X-ray energy dispersive spectrometry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.Image by John Mansfield
Selected area diffraction pattern of alloy phase with strong structure factor intensity variation in the 00X spots.Image by John Mansfield
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