EMAL | Instrument Status

Selected area diffraction pattern of alloy phase with strong structure factor intensity variation in the 00X spots.

Image by John Mansfield

Carbon Nanotubes Modified with an Ultrafast Laser
Low magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.

Image by John Mansfield
Ridged Morphology of Aluminum Oxide formed on Ni-Al-Cr-W superalloy
Surface oxide formed during oxidation of experimental W-rich Ni-base superalloys in simulated impure-He environment. SE image recorded on Philips XL30 FEG SEM at 20kV

Image by Raghav Adharapurapu, Prof. Pollock's Research Group
Enviromental SEM image of cooked bacon
ESEM image of piece of bacon from visiting grdauate student breakfast March 2011. Image recorded on the FEI Quanta 3D at 30kV and 0.5Torr of water vapor.

Image by John Mansfield
O Map on Semiconductor Chip
An X-ray energy dispersive spectrometry map recorded using the Oxygen K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield
Nanobamas
SEM image of nanotube forests assembled into the likeness of Barack Obama.

Image by Sameh Tawfick

Selected area diffraction pattern of alloy phase with strong structure factor intensity variation in the 00X spots.

Image by John Mansfield

Instrument Status

Central Campus
CAMECA SX100 EMPA	OK
Carbon evaporator	OK
Enraf-Nonius XTG	OK
Gold sputter coater	OK
Hitachi S3200N SEM	OK
Philips CM12 STEM	NA Major vacuum failure, instrument is down until further notice and may be retired from service completely.
Rigaku Ultima IV XRD	OK
Scintag Powder XRD	OK
North Campus
Bruker Dimension Icon AFM	OK New Scanner installed, new procedures for use, please check with EMAL staff before using it.
Cameca Atomprobe	OK
FEI Nova Nanolab	OK Omniprobe now functional.
FEI Quanta 3D	OK Ok
JEOL 2010F	OK
JEOL 2100F CsCorr	OK
JEOL 3011	OK
Kratos Axis Ultra XPS	NA X-ray Source problem due to water cooling problem
XL30 ESEM	OK
XL30 FEG	OK